Microscopy for the Conservator of Art and Artifacts (at International Preservation Studies Center), June 26-30, 2017
This course will be taught by Dr. Gary J. Laughlin of McCrone Research Institute and held at the International Preservation Studies Center in Mount Carroll, IL (formerly Campbell Center for Historic Preservation Studies). To register, please visit the Center’s website. For more information, call 815-244-1173.
COURSE OUTLINE & SYLLABUS
Course schedule: 8:00 a.m. – 5:00 p.m. Monday – Thursday, and 8:00 a.m. – 12:00 p.m. Friday
This course covers the core polarized light microscopy curriculum and methods of sampling, characterization and identification of pigments, grounds, media and fibers.
• Optics, reflection, refraction, contrast, resolution, numerical aperture, refractive index, crystal morphology and microchemical tests
• Identification, function, adjustment, care and cleaning of polarized light microscope components
• Köhler illumination, micrometry, measuring particle size, fiber diameters, pigment particle size and layer thickness
Single polar crystal optics, refractive indices, methods of measurement, Becke line, pleochroism, dispersion staining
• Crossed polar crystal optics, birefringence, compensators, Michel-Lévy chart, sign of elongation and extinction
• Fiber characteristics (vegetable, animal and man-made).
• Sampling and mounting techniques, use of atlases and reference standards, identification of pigments (particle shape, surface, cleavage, isotropy, anisotropy, refractive index, Becke line, color, pleochroism, birefringence, etc.)
• Identification of media, surface coatings and glue
• Study of paintings, selection area, sampling and mounting techniques (cross sections and crushings), characterization and identification
• Microminiaturization and analytical procedures (ultramicrochemistry, micro solubility, micro density, micro refractive index, micro grinding, micro X-ray diffraction, particle-picking, micro extraction)
• Photomicrography (illumination, selection and preparation of sample, precise focusing, exposure measurement and control)
• Special methods (phase, interference, fluorescence, electron microscopes, microprobes, chromatography, emission spectroscopy, mass spectrometry and dating methods)
There is no prerequisite for this course, and it satisfies the same prerequisites as course 1201.