Advanced Forensic Microscopy - Trace Evidence (1701) [Same as Advanced Applied Polarized Light Microscopy (1251)]: June 16-20, 2008
COURSE OUTLINE & SYLLABUS
This advanced course will review Koehler illumination (if necessary) and all PLM techniques [single polar: shape, size, surface, homogeneity, association, transparency, color, pleochroism, image contrast, refractive indices, dispersion staining; crossed polars: retardation, birefringence, anomalous polarization colors, extinction, sign of elongation, interference figures, correlation of optics and morphology, etc.].
Observations will be applied to hair, fibers, glass, soils, drugs, explosives, gunshot residue, paint and general dust samples. About one quarter to one third of the week will be lectures and demonstrations. Each student can elect which trace evidence area(s) he/she practices during the remainder of the week.
Same as Advanced Applied Polarized Light Microscopy 1251.
Prerequisite: 1204 or equivalent.
Day 1:
Review of the microscope, illumination and particle characterization methods using one polar.
Day 2:
Review of particle characterization using two polars; single particle manipulation and ultramicrominiaturization of PLM techniques.
Day 3:
Methods of trace evidence analysis (general).
Day 4:
Study of fibers, hairs, glass, soils, paints and explosives.
Day 5:
Study of drugs, gunshot residue and general dust.
Note: This course runs Monday-Friday with class ending at noon on Friday.

June 16th, June 17th, June 18th, June 19th, June 20th